Additional tests are carried out for domestic production of Electronic Component in order to identify and reject products with obvious or hidden defects.
Stages of additional testing of Electronic Component:
- input control;
- screening tests (detection and removal of defective products or products from which early failures should be expected);
- diagnostic non-destructive testing (technical control of electronic components that does not impair its subsequent operational suitability and reliability. It is carried out according to informative parameters, including those not specified in TU, in the conditions and conditions conducive to the manifestation of product defects, as well as the results of the assessment of parameter drift after testing);
- destructive physical analysis (the type of destructive control conducted to establish the conformity of the design and technological parameters of electronic components to the requirements of regulatory and technical documentation).
All stages of the tests are carried out for 100% Electronic Component (except of destructive physical analysis, which is carried out for some types of Electronic Component on a selective amount).
The input control implies the performance of typical operations for the electronic components described in the input control section. The composition and sequence of operations, as well as methods for screening tests, diagnostic non-destructive testing and destructive physical analysis are individual for various types of electronic components. This information is recorded in the Test Program, which is developed by the specialists of RADIOAUTOMATIC LTD or provided by the customer. The results of additional Electronic Component tests are recorded in the reporting documentation (in the protocols and conclusion).